五福彩票821app下载

RFIC Channel

RFIC, MMIC, semiconductor channel

ARTICLES

DOCUMENTS AND FILES

Bridging the Gap Between RF Front-End Module Characterization and Production Test With the Semiconductor Test System

With the modern mobile device revolution, semiconductor suppliers are challenged to increase capability, integration, and performance while reducing time to market. Test needs a new approach based on an open, flexible platform at significantly lower cost. NI is bridging this gap by building on the stability and capability of the PXI platform to deliver off-the-shelf modular technology to both the characterization and production engineer.
See More Videos
乐优彩票天天红单下载 乐优炫彩app下载 乐优彩票登入,备用,官方网址 乐优炫彩官网 乐优彩票网址是多少 乐优炫彩彩票app下载 乐优炫彩app 乐体育app下载 乐优炫彩app天天红单 乐优炫彩天天红单